Posted in conferences, industry, thin films
Tags: coatings, conferences, film characterisation, Film Growth, high rate sputtering, high resolution analytical techniques, HIPIMS, Industrial Applications, industry, Institute of Physics, Johannes Struempfel, Manchester Metropolitan University, Peter Kelly, Plasma diagnostics, Plasma Physics Group and Ion, Plasma Surface Interaction Group, process control, Process Modelling, pulsed reactive sputtering, pvd coatings, Ralf Bandorf, Reactive Sputter Deposition, RSD2009, Sputtering, Stanislav Mraz, thin films, Wouter Leroy